JPH0475469B2 - - Google Patents

Info

Publication number
JPH0475469B2
JPH0475469B2 JP57180060A JP18006082A JPH0475469B2 JP H0475469 B2 JPH0475469 B2 JP H0475469B2 JP 57180060 A JP57180060 A JP 57180060A JP 18006082 A JP18006082 A JP 18006082A JP H0475469 B2 JPH0475469 B2 JP H0475469B2
Authority
JP
Japan
Prior art keywords
sample
current
pulse
output signal
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57180060A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58108465A (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS58108465A publication Critical patent/JPS58108465A/ja
Publication of JPH0475469B2 publication Critical patent/JPH0475469B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31915—In-circuit Testers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Locating Faults (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
JP57180060A 1981-10-16 1982-10-15 欠陥ノードを探索する方法及び装置 Granted JPS58108465A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US31215881A 1981-10-16 1981-10-16
US312158 1989-02-21

Publications (2)

Publication Number Publication Date
JPS58108465A JPS58108465A (ja) 1983-06-28
JPH0475469B2 true JPH0475469B2 (en]) 1992-11-30

Family

ID=23210135

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57180060A Granted JPS58108465A (ja) 1981-10-16 1982-10-15 欠陥ノードを探索する方法及び装置

Country Status (6)

Country Link
EP (1) EP0077725B1 (en])
JP (1) JPS58108465A (en])
KR (1) KR910002020B1 (en])
AU (1) AU568485B2 (en])
CA (1) CA1206526A (en])
DE (1) DE3270882D1 (en])

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU664722B2 (en) * 1991-11-29 1995-11-30 H.P.M. Industries Pty Limited Apparatus for determining the relative positions of power outlets within an electrical circuit
WO1999031588A1 (en) * 1997-12-14 1999-06-24 E & M Engineering (Y.G.R.) Ltd. Method, apparatus and device for digital testing and diagnostics of pc boards
US6704277B1 (en) * 1999-12-29 2004-03-09 Intel Corporation Testing for digital signaling
CN112014725B (zh) * 2020-09-02 2023-03-10 韩熔 电子电路板的多结点波形预存储故障检测方法
CN114527355A (zh) * 2022-02-23 2022-05-24 中车青岛四方车辆研究所有限公司 一种交流牵引供电的网压异常检测方法和系统

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51108253A (ja) * 1975-03-19 1976-09-25 Mitsuo Makino Chirakutentansasochi
US4074188A (en) * 1975-08-01 1978-02-14 Testline Instruments, Inc. Low impedance fault detection system and method
JPS5331253A (en) * 1976-09-02 1978-03-24 Nitsuchitsu Kougiyou Kk Rotary ball mill shell with elastic rubber lining
US4216539A (en) * 1978-05-05 1980-08-05 Zehntel, Inc. In-circuit digital tester
DE3022279A1 (de) * 1979-06-23 1981-01-08 Membrain Ltd Verfahren und einrichtung zur lokalisierung eines fehlers in einem elektronischen schaltkreis
US4345201A (en) * 1979-12-20 1982-08-17 Membrain Limited Fault location system with enhanced noise immunity
US4517511A (en) * 1981-10-16 1985-05-14 Fairchild Camera And Instrument Corporation Current probe signal processing circuit employing sample and hold technique to locate circuit faults

Also Published As

Publication number Publication date
AU568485B2 (en) 1988-01-07
JPS58108465A (ja) 1983-06-28
EP0077725A1 (en) 1983-04-27
AU8940682A (en) 1983-04-21
EP0077725B1 (en) 1986-04-30
KR840002109A (ko) 1984-06-11
KR910002020B1 (ko) 1991-03-30
DE3270882D1 (en) 1986-06-05
CA1206526A (en) 1986-06-24

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